Title :
Improvement of analog circuit fault detectability using fault detection observers
Author :
Vermeiren, W. ; Straube, B. ; Elst, G.
Author_Institution :
Fraunhofer Inst. fur Integrierte Schaltungen, Erlangen, Germany
Abstract :
Presents the application of fault detection observers as used in dynamic systems fault diagnosis to analog circuit testing. It will be shown that the fault detectability performance of fault detection observers is higher than those of optimal test vector generation methods which are based on maximising the differences of directly compared responses from the specification and the unit under test.<>
Keywords :
analogue circuits; fault location; integrated circuit testing; linear integrated circuits; analog circuit fault detectability; analog circuit testing; detectability performance; directly compared responses; fault detection observers; optimal test vector generation; unit under test; Analog circuits; Circuit faults; Circuit testing; Electrical capacitance tomography; Electrical fault detection; Fault detection; Fault diagnosis; Intrusion detection; Signal analysis; Vectors;
Conference_Titel :
VLSI Test Symposium, 1993. Digest of Papers., Eleventh Annual 1993 IEEE
Conference_Location :
Atlantic City, NJ, USA
Print_ISBN :
0-8186-3830-3
DOI :
10.1109/VTEST.1993.313321
