DocumentCode :
1985585
Title :
Random gradient index metamaterials
Author :
Liu, Ruopeng ; Ji, Chunlin ; Mock, Jack J. ; Cui, Tiejun ; Smith, David R.
Author_Institution :
Dept. of Electr. & Comput. Eng., Duke Univ., Durham, NC
fYear :
2008
fDate :
9-12 Nov. 2008
Firstpage :
248
Lastpage :
250
Abstract :
We report a broadband reflectionless gradient random medium design and experimental implementation by using metamaterial technology. This gradient random medium matches the impedance of the air and gradually change its refraction index randomly, creating a puzzle for wave propagation in front of a metal conductor. Thus, such type of coating is expected to diffuse the reflection waves from a conductor metal. The implementation of such device needs, in our experiment, more than 30,000 different unit cells. Obviously, such large scale design and fabrication mask generation have been out of the scope of traditional manual production. We propose an automatical metamaterial design system, which made the implementation of gradient random medium possible and provide the technique of large scale metamaterial unit-cell design. The design is verified by the 2D near field scanning mapper measurement and the angular measurement. The measurement results show that the designed sample works well as we expected.
Keywords :
broadband networks; gradient index optics; metamaterials; refractive index; 2D near field scanning mapper measurement; angular measurement; broadband reflectionless gradient random medium; impedance; metal conductor; metamaterials; random gradient index; refraction index; wave propagation; Conductors; Impedance; Large-scale systems; Magnetic materials; Metamaterials; Nonlinear optics; Optical reflection; Optical refraction; Permeability; Permittivity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Metamaterials, 2008 International Workshop on
Conference_Location :
Nanjing
Print_ISBN :
978-1-4244-2608-9
Electronic_ISBN :
978-1-4244-2609-6
Type :
conf
DOI :
10.1109/META.2008.4723589
Filename :
4723589
Link To Document :
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