Title :
SNR measurement based on linearity test for ADC BIST
Author :
Duan, Jingbo ; Chen, Degang
Author_Institution :
Dept. of Electr. & Comput. Eng., Iowa State Univ., Ames, IA, USA
Abstract :
Linearity and spectral performance test contributes most cost of ADC test. This paper presents a new method for testing an ADC´s SNR from its linearity test data. The method does not require additional data acquisition or accurate sinusoidal stimulus. Data collected for linearity test is used to compute the input noise power and test ADC´s SNR. Both simulation and experimental results show that the proposed method can estimate SNR value accurately.
Keywords :
analogue-digital conversion; built-in self test; ADC BIST; ADC test; SNR measurement; data acquisition; linearity test; sinusoidal stimulus; spectral performance test; Built-in self-test; Histograms; Linearity; Random variables; Signal to noise ratio;
Conference_Titel :
Circuits and Systems (ISCAS), 2011 IEEE International Symposium on
Conference_Location :
Rio de Janeiro
Print_ISBN :
978-1-4244-9473-6
Electronic_ISBN :
0271-4302
DOI :
10.1109/ISCAS.2011.5937553
