DocumentCode :
1985922
Title :
Generation of testable designs from behavioral descriptions using high level synthesis tools
Author :
Varma, Kamal K. ; Vishakantaiah, Praveen ; Abraham, Jacob A.
Author_Institution :
Comput. Eng. Res. Center, Texas Univ., Austin, TX, USA
fYear :
1993
fDate :
6-8 April 1993
Firstpage :
124
Lastpage :
130
Abstract :
Develops a synthesis-for-testability procedure wherein behavioral modeling techniques are used to generate testable designs. Knowledge about the accessibility of embedded modules is extracted from the behavioral design, analyzed, and any modification required subsequently incorporated in the behavioral design. Results show that when the resulting testable circuit is synthesized from this modified design using a high level synthesis tool, the overhead for testability is quite small, especially for large circuits.<>
Keywords :
design for testability; logic CAD; logic testing; behavioral descriptions; behavioral design; embedded modules; high level synthesis tools; overhead; synthesis-for-testability procedure; testable designs; Automatic testing; Built-in self-test; Circuit synthesis; Circuit testing; Design automation; Design engineering; Design for testability; High level synthesis; Jacobian matrices; Performance evaluation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 1993. Digest of Papers., Eleventh Annual 1993 IEEE
Conference_Location :
Atlantic City, NJ, USA
Print_ISBN :
0-8186-3830-3
Type :
conf
DOI :
10.1109/VTEST.1993.313337
Filename :
313337
Link To Document :
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