Title :
Generation of testable designs from behavioral descriptions using high level synthesis tools
Author :
Varma, Kamal K. ; Vishakantaiah, Praveen ; Abraham, Jacob A.
Author_Institution :
Comput. Eng. Res. Center, Texas Univ., Austin, TX, USA
Abstract :
Develops a synthesis-for-testability procedure wherein behavioral modeling techniques are used to generate testable designs. Knowledge about the accessibility of embedded modules is extracted from the behavioral design, analyzed, and any modification required subsequently incorporated in the behavioral design. Results show that when the resulting testable circuit is synthesized from this modified design using a high level synthesis tool, the overhead for testability is quite small, especially for large circuits.<>
Keywords :
design for testability; logic CAD; logic testing; behavioral descriptions; behavioral design; embedded modules; high level synthesis tools; overhead; synthesis-for-testability procedure; testable designs; Automatic testing; Built-in self-test; Circuit synthesis; Circuit testing; Design automation; Design engineering; Design for testability; High level synthesis; Jacobian matrices; Performance evaluation;
Conference_Titel :
VLSI Test Symposium, 1993. Digest of Papers., Eleventh Annual 1993 IEEE
Conference_Location :
Atlantic City, NJ, USA
Print_ISBN :
0-8186-3830-3
DOI :
10.1109/VTEST.1993.313337