Aliasing computation using fault simulation with fault dropping

Accurate analysis of aliasing in built-in test environments is considered highly computation intensive, due to the requirement to perform nonfault dropping fault simulation. Fault dropping is possible when computing the exact aliasing of modeled faults for common output response compression circuits. Fault dropping is most effective when the test set size is small. Extensions to large test sets are also considered. The authors present a fault simulation procedure that takes advantage of fault dropping and present experimental results to support its effectiveness.<>