• DocumentCode
    1986046
  • Title

    On the maximum value of aliasing probabilities for single input signature registers

  • Author

    Feng, Shou-Ping ; Fujiwara, Toru ; Kasami, Tadao ; Iwasaki, Kazuhiko

  • Author_Institution
    Fac. of Eng. Sci., Osaka Univ., Japan
  • fYear
    1993
  • fDate
    6-8 April 1993
  • Firstpage
    267
  • Lastpage
    274
  • Abstract
    The aliasing error performance of signature registers is measured by the maximum values of the aliasing error probabilities for certain ranges of the bit-error rate (and those of the test length). Based on these measurements, the authors evaluate the performances of all the single input signature registers whose feedback polynomials are primitive polynomials of degree 16 and generator polynomials of the double-error-correcting BCH codes of the same degree. When the degree of the feedback polynomial is large (e.g. 32), it is computationally hard to obtain the exact value of the aliasing probability. But the authors observe that the numbers of codewords with large weights in the corresponding code determine the maximum value of the aliasing probabilities in the range 0>
  • Keywords
    VLSI; built-in self test; error correction codes; logic testing; probability; shift registers; aliasing error performance; aliasing probabilities; bit-error rate; codewords; double-error-correcting BCH codes; exact value; feedback polynomials; maximum value; primitive polynomials; single input signature registers; Automatic testing; Built-in self-test; Circuit testing; Compaction; Feedback circuits; Length measurement; Linear feedback shift registers; Performance evaluation; Polynomials; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 1993. Digest of Papers., Eleventh Annual 1993 IEEE
  • Conference_Location
    Atlantic City, NJ, USA
  • Print_ISBN
    0-8186-3830-3
  • Type

    conf

  • DOI
    10.1109/VTEST.1993.313359
  • Filename
    313359