• DocumentCode
    1986331
  • Title

    Synthesis and characterization of Gallium Nitride nanocrystals

  • Author

    Ganesh, V. ; Suresh, Smitha ; Sudhakar, S. ; Premkumar, T. ; Baskar, K.

  • Author_Institution
    Crystal Growth Centre, Anna Univ., Chennai, India
  • fYear
    2009
  • fDate
    22-24 Dec. 2009
  • Firstpage
    454
  • Lastpage
    456
  • Abstract
    A simple method to synthesize Gallium Nitride (GaN) powder using gallium trichloride (GaCl3) and ethylene diamine tetra acetic acid (EDTA) as starting materials has been discussed in this article. GaN nanocrystals were synthesized by nitradation of Gallium-EDTA complex at different temperatures of 600??C, 700??C, 800??C and 900??C in ammonia (NH3) atmosphere. X-ray diffraction analysis revealed the formation of single phase hexagonal GaN for the compound synthesized at temperature of 900??C. However the other low temperature synthesis resulted mixed phases of ??-Ga2O3, 2GaONO3.N2O5 and GaN. Scanning electron microscopy images show that the particles were in the form of agglomerates. The average size of the particle was found to be ~20 nm by transmission electron microscopy. Energy Dispersive X-ray diffraction analysis shows variation in elemental composition of synthesized compound with respect to temperature. The room temperature photoluminescence exhibits band-edge emission of GaN at 3.46 eV.
  • Keywords
    III-V semiconductors; X-ray chemical analysis; X-ray diffraction; crystal growth from vapour; crystal structure; gallium compounds; nanofabrication; nanoparticles; nitridation; particle size; photoluminescence; scanning electron microscopy; semiconductor growth; transmission electron microscopy; wide band gap semiconductors; GaN; X-ray diffraction; agglomerates; ammonia atmosphere; average particle size; band-edge emission; elemental composition; energy dispersive X-ray analysis; ethylene diamine tetra acetic acid; gallium nitride nanocrystals; gallium trichloride; gallium-EDTA complex; low-temperature synthesis; mixed phases; nitridation; room temperature photoluminescence; scanning electron microscopy; single phase hexagonal structure; temperature 293 K to 298 K; temperature 600 degC to 900 degC; transmission electron microscopy; Atmosphere; Dispersion; Gallium nitride; III-V semiconductor materials; Nanocrystals; Powders; Scanning electron microscopy; Temperature; Transmission electron microscopy; X-ray diffraction; Photoluminescence; Raman spectroscopy; Semiconductors; X-ray diffraction; component; nanocrystals;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Emerging Trends in Electronic and Photonic Devices & Systems, 2009. ELECTRO '09. International Conference on
  • Conference_Location
    Varanasi
  • Print_ISBN
    978-1-4244-4846-3
  • Type

    conf

  • DOI
    10.1109/ELECTRO.2009.5441068
  • Filename
    5441068