DocumentCode :
1986331
Title :
Synthesis and characterization of Gallium Nitride nanocrystals
Author :
Ganesh, V. ; Suresh, Smitha ; Sudhakar, S. ; Premkumar, T. ; Baskar, K.
Author_Institution :
Crystal Growth Centre, Anna Univ., Chennai, India
fYear :
2009
fDate :
22-24 Dec. 2009
Firstpage :
454
Lastpage :
456
Abstract :
A simple method to synthesize Gallium Nitride (GaN) powder using gallium trichloride (GaCl3) and ethylene diamine tetra acetic acid (EDTA) as starting materials has been discussed in this article. GaN nanocrystals were synthesized by nitradation of Gallium-EDTA complex at different temperatures of 600??C, 700??C, 800??C and 900??C in ammonia (NH3) atmosphere. X-ray diffraction analysis revealed the formation of single phase hexagonal GaN for the compound synthesized at temperature of 900??C. However the other low temperature synthesis resulted mixed phases of ??-Ga2O3, 2GaONO3.N2O5 and GaN. Scanning electron microscopy images show that the particles were in the form of agglomerates. The average size of the particle was found to be ~20 nm by transmission electron microscopy. Energy Dispersive X-ray diffraction analysis shows variation in elemental composition of synthesized compound with respect to temperature. The room temperature photoluminescence exhibits band-edge emission of GaN at 3.46 eV.
Keywords :
III-V semiconductors; X-ray chemical analysis; X-ray diffraction; crystal growth from vapour; crystal structure; gallium compounds; nanofabrication; nanoparticles; nitridation; particle size; photoluminescence; scanning electron microscopy; semiconductor growth; transmission electron microscopy; wide band gap semiconductors; GaN; X-ray diffraction; agglomerates; ammonia atmosphere; average particle size; band-edge emission; elemental composition; energy dispersive X-ray analysis; ethylene diamine tetra acetic acid; gallium nitride nanocrystals; gallium trichloride; gallium-EDTA complex; low-temperature synthesis; mixed phases; nitridation; room temperature photoluminescence; scanning electron microscopy; single phase hexagonal structure; temperature 293 K to 298 K; temperature 600 degC to 900 degC; transmission electron microscopy; Atmosphere; Dispersion; Gallium nitride; III-V semiconductor materials; Nanocrystals; Powders; Scanning electron microscopy; Temperature; Transmission electron microscopy; X-ray diffraction; Photoluminescence; Raman spectroscopy; Semiconductors; X-ray diffraction; component; nanocrystals;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Emerging Trends in Electronic and Photonic Devices & Systems, 2009. ELECTRO '09. International Conference on
Conference_Location :
Varanasi
Print_ISBN :
978-1-4244-4846-3
Type :
conf
DOI :
10.1109/ELECTRO.2009.5441068
Filename :
5441068
Link To Document :
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