Title :
Pattern generator card, emulation, and debug
Author :
Dunn, Stephcn M. ; Balazich, D.G. ; Lange, Lawrence K. ; Montillo, Charlotte C.
Author_Institution :
IBM Corp., Hopewell Junction, NY, USA
Abstract :
Details a pattern generator card used in a high speed VLSI test system, a software emulation of that card, and card debug procedure. The Advanced Test System built at IBM East Fishkill contains primarily pin electronics cards, pattern generator cards, and power and clock distribution cards. The software emulator, called PGEM, for pattern generator emulation, serves two major purposes: it facilitates off-line debug of pattern generator cards; and, when used with a waveform tool, it permits verification of test programs without wasting system time. The simplification of off-line debug is important in terms of time savings and reduction of expensive incorrect diagnoses.<>
Keywords :
VLSI; automatic test equipment; boundary scan testing; development systems; integrated circuit testing; card debug procedure; clock distribution cards; high speed VLSI test system; off-line debug; pattern generator card; pin electronics cards; software emulation; time savings; waveform tool; Clocks; Electronic equipment testing; Emulation; Power generation; Software debugging; Software systems; Software testing; System testing; Test pattern generators; Very large scale integration;
Conference_Titel :
VLSI Test Symposium, 1993. Digest of Papers., Eleventh Annual 1993 IEEE
Conference_Location :
Atlantic City, NJ, USA
Print_ISBN :
0-8186-3830-3
DOI :
10.1109/VTEST.1993.313379