DocumentCode :
1986473
Title :
Silicon Monolithic Millimeter Wave Sources
Author :
Rosen, A. ; Stabile, P. ; McGinn, J. ; Wu, C. ; Magee, C. ; Landford, W.J.
Author_Institution :
RCA David Sarnoff Research Center, Princeton, NJ USA
fYear :
1983
fDate :
3-8 Sept. 1983
Firstpage :
241
Lastpage :
246
Abstract :
We have investigated novel techniques for the fabrication of silicon IMPATTdiodes for use at frequencies of up to 300 GHz. The basic techniques described are ion implantation, laser annealing, transmission electron microscopy (TEM), unique secondary ion mass spectrometry (SIMS - profile diagnostics), and novel wafer thinning. These techniques yield ultra -thin, reproducible wafers, and are currently being used in the development of silicon hybrid and monolithic integrated millimeter-wave sources.
Keywords :
Amorphous materials; Annealing; Circuits; Crystallization; Diffraction; Electrons; Frequency; Ion implantation; Millimeter wave technology; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference, 1983. 13th European
Conference_Location :
Nurnberg, Germany
Type :
conf
DOI :
10.1109/EUMA.1983.333234
Filename :
4131896
Link To Document :
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