DocumentCode :
1986506
Title :
Development and cold testing of vacuum RF window for C band 250 kW CW power klystron
Author :
Lamba, O.S. ; Kaushik, Meenu ; Kumar, Sushil ; Jindal, Vishnu ; Singh, Vijay ; Ratan, Shilpam ; Pal, Debasish ; Kant, D. ; Joshi, L.M.
Author_Institution :
Central Electron. Eng. Res. Inst. Pilani(Rajasthan), Council of Sci. & Ind. Res., New Delhi, India
fYear :
2009
fDate :
22-24 Dec. 2009
Firstpage :
429
Lastpage :
431
Abstract :
The paper deals with the design fabrication and cold testing of vacuum RF window for C-band 250 kW CW power klystron. The simulation of the window has been carried out using the CST microwave studio software. The proposed window is designed for 5 GHz operating frequency for handling 250 kW of RF power. In the proposed window geometry, metallized alumina disc (99.5 % purity) of diameter 56 mm and thickness 1.5 mm is brazed in a cylindrical waveguide of diameter 56 mm. The cylindrical waveguide is terminated to WR 187 waveguide at its both ends. The return loss and insertion loss of the above mentioned window has been found to be -48 dB and 0.05 dB respectively which are well matched with experimental values. The bandwidth of 170 MHz was achieved. The window performance has been found satisfactory for microwave transmission.
Keywords :
S-parameters; alumina; circular waveguides; klystrons; CST microwave studio software; bandwidth 170 MHz; cold testing; cylindrical waveguide; frequency 5 GHz; metallized alumina disc; microwave transmission; power 250 kW; power klystron; size 1.5 mm; size 56 mm; vacuum RF window; Bandwidth; Dielectric constant; Dielectric losses; Electronic equipment testing; Insertion loss; Klystrons; Microwave devices; Radio frequency; Scattering parameters; Vacuum systems; Klystron; RF Window; S - parameters; alumina; pill-box type;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Emerging Trends in Electronic and Photonic Devices & Systems, 2009. ELECTRO '09. International Conference on
Conference_Location :
Varanasi
Print_ISBN :
978-1-4244-4846-3
Type :
conf
DOI :
10.1109/ELECTRO.2009.5441074
Filename :
5441074
Link To Document :
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