Title :
Oharacteristics of FIN Lines with Arbitrary Dimensions Calculated from Data for Lines in Standard Enclosures
Author_Institution :
Dept. of Electrical Engineering, University of Ottawa, Canada K1N 6N5
Abstract :
The dispersion characteristics of fin lines with arbitrary dimensions can be obtained from data published for fin lines centered in standard waveguide enclosures. The procedure is based on the transverse resonance method which has been widely used in the past to evaluate the properties of slab-loaded waveguides, ridged waveguides and similar structures.
Keywords :
Capacitance; Dielectric constant; Dispersion; Millimeter wave technology; Permittivity; Planar waveguides; Propagation constant; Resonance; Standards publication; Structural engineering;
Conference_Titel :
Microwave Conference, 1983. 13th European
Conference_Location :
Nurnberg, Germany
DOI :
10.1109/EUMA.1983.333237
