Title :
Low complexity baseband transceiver design for narrow band power line communication
Author :
Hwang, Yin-Tsung ; Chang, Feng-Ming ; Chen, Shin-Wen
Author_Institution :
Dept. of Electr. Eng., Nat. Chung Hsing Univ., Taichung, Taiwan
Abstract :
A low complexity baseband transceiver design for power line communication is presented. The proposed baseband transceiver adopts an M-ary Bi-Orthogonal Keying (MBOK) based Direct-Sequence Spread Spectrum (DSSS) modulation scheme. The front end signal is further modulated by a FSK scheme to combat serious channel impairments in power line network. No A/D or D/A converters are required and a simple dual-phase sampling technique is employed for timing recovery. Occupying a bandwidth of 400 kHz, the design has a 200 kHz chip rate and is capable of supporting a reliable 100 kbps data rate. The BER can be lower than 10-3 when the SNR value reaches 20dB. The FPGA implementation results indicate the baseband kernel design consumes less than 3,000 logic gates and features a low circuit complexity and protocol robust solution.
Keywords :
carrier transmission on power lines; circuit complexity; error statistics; field programmable gate arrays; frequency shift keying; logic gates; protocols; radio transceivers; spread spectrum communication; A/D converter; BER; D/A converter; DSSS modulation scheme; FPGA implementation; FSK scheme; MBOK; SNR value; bandwidth 200 kHz; bandwidth 400 kHz; baseband kernel design; bit rate 100 kbit/s; channel impairments; circuit complexity; direct-sequence spread spectrum modulation scheme; dual-phase sampling technique; front end signal; logic gates; low complexity baseband transceiver design; m-ary bi-orthogonal keying; narrow band power line communication; noise figure 20 dB; power line network; protocol robust solution; timing recovery; Baseband; Bit error rate; Complexity theory; Frequency shift keying; Matched filters; Noise;
Conference_Titel :
Circuits and Systems (ISCAS), 2011 IEEE International Symposium on
Conference_Location :
Rio de Janeiro
Print_ISBN :
978-1-4244-9473-6
Electronic_ISBN :
0271-4302
DOI :
10.1109/ISCAS.2011.5937597