Title :
Performance evaluation of optoelectronic oscillators
Author :
Römisch, S. ; Kitching, J. ; Ferrè-Pikal, E. ; Hollberg, L. ; Walls, F.L.
Author_Institution :
Nat. Inst. of Stand. & Technol., Boulder, CO, USA
Abstract :
In the present work, we establish the importance of amplifier phase noise and system environmental fluctuations in determining the low-frequency (f<100 Hz) noise of the oscillator. The system, designed to be a low phase noise microwave oscillator, has a measured single-side-hand (SSB) phase noise of -123 dB/Hz (relative to 1 rad2/Hz) at 10 kHz from the 10.6 GHz carrier. The fractional frequency stability required for advanced atomic frequency standards is of the order of 10-4/√τ. This requirement might be met with an ideal version of this optoelectronic oscillator if we could reach the noise limit determined by the optical shot noise
Keywords :
discriminators; frequency stability; frequency standards; microwave oscillators; microwave photonics; optical delay lines; phase noise; shot noise; 10.6 GHz; SSB phase noise; amplifier phase noise; atomic frequency standards; fractional frequency stability; low-frequency noise; microwave oscillator; noise limit; optical shot noise; optoelectronic oscillators; system environmental fluctuations; 1f noise; Fluctuations; Low-frequency noise; Low-noise amplifiers; Microwave measurements; Microwave oscillators; Optical amplifiers; Optical noise; Phase noise; Working environment noise;
Conference_Titel :
Frequency and Time Forum, 1999 and the IEEE International Frequency Control Symposium, 1999., Proceedings of the 1999 Joint Meeting of the European
Conference_Location :
Besancon
Print_ISBN :
0-7803-5400-1
DOI :
10.1109/FREQ.1999.841367
