Title :
Reliability evaluation of hypercubes and hypernets using spanning tree approach
Author :
Kaur, D. ; Singh, Harpreet ; Kaushal, R.P.
Author_Institution :
Dept. of Electr. & Comput. Eng., Wayne State Univ., Detroit, MI, USA
Abstract :
The reliability evaluation of two different topologies, hypercubes and hypernets, using the spanning tree/clustering approach is presented. Only hypernets constructed from hypercubes as the basic building blocks are considered in this evaluation. Hypernets and hypercubes of equal number of processor/memory nodes but having different topological features are chosen. The dependence of node-to-node communication reliability on various architectural parameters is shown
Keywords :
hypercube networks; multiprocessor interconnection networks; reliability theory; architectural parameters; hypercubes; hypernets; memory nodes; node-to-node communication reliability; processor nodes; reliability evaluation; spanning tree approach; Hypercubes; Joining processes; Reliability engineering; Telecommunication network reliability; Topology; Tree graphs;
Conference_Titel :
Circuits and Systems, 1989., Proceedings of the 32nd Midwest Symposium on
Conference_Location :
Champaign, IL
DOI :
10.1109/MWSCAS.1989.102006
