DocumentCode
1987411
Title
A Programmable Robust Current Reference in ROIC with Low Working Temperature
Author
Tang, Ju ; Liu, Dan ; Chen, Zhongjian ; Zhang, Xing ; Ji, Lijiu
Author_Institution
Institute of Microelectronics, Peking University, Beijing 100871, P. R. China. Email: tangju@ime.pku.edu.cn
fYear
2005
fDate
19-21 Dec. 2005
Firstpage
275
Lastpage
278
Abstract
This paper describes a programmable current reference which is designed to work stably over supply voltage in 77K without external component. It is designed to be used in an IRFPA ROIC (readout IC) as a reference current source. This current reference is based on CSMC 0.5 μm standard CMOS process with supply voltage of 5V. In low-precision testing condition, measurement result of the output current varies from about 80 nA to 120 nA with the supply voltage variation from 2.8V to 6V at room temperature.
Keywords
CMOS process; Circuit stability; Circuit testing; Current measurement; Current supplies; MOSFETs; Microelectronics; Robustness; Temperature sensors; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices and Solid-State Circuits, 2005 IEEE Conference on
Print_ISBN
0-7803-9339-2
Type
conf
DOI
10.1109/EDSSC.2005.1635260
Filename
1635260
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