• DocumentCode
    1987742
  • Title

    Full band calculations of low-field mobility in p-type silicon nanowire MOSFETs

  • Author

    Neophytou, N. ; Stanojevic, Zlatan ; Kosina, Hans

  • Author_Institution
    Inst. for Microelectron., Tech. Univ. Wien, Vienna, Austria
  • fYear
    2013
  • fDate
    3-5 Sept. 2013
  • Firstpage
    81
  • Lastpage
    84
  • Abstract
    The bandstructure of p-type gated Si nanowires (NWs) is calculated self-consistently using the sp3d5s* atomistic tight-binding (TB) model and the 2D Poisson equation. The Boltzmann transport formalism is then used for calculation of the low-field mobility. We show that the bandstructures of NWs in the [110] and [111] transport orientations change as the channel is driven into inversion, which causes a ~50% increase in their intrinsic phonon-limited hole mobility. For short channel MOSFET devices, however, the total mobility is lower that the intrinsic mobility because it is affected by the so-called “ballistic” mobility.
  • Keywords
    Boltzmann equation; MOSFET; band structure; elemental semiconductors; nanowires; semiconductor device models; silicon; tight-binding calculations; 2D Poisson equation; Boltzmann transport formalism; Si; atomistic tight-binding model; ballistic mobility; band structure; full band calculations; intrinsic phonon-limited hole mobility; low-field mobility; p-type silicon nanowire MOSFET; short channel MOSFET devices; transport orientations; Computational modeling; Electrostatics; Logic gates; Mathematical model; Resistance; Silicon; Transistors; “ballistic” mobility; Boltzmann transport; Si nanowires; bandstrucutre; mobility; transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Simulation of Semiconductor Processes and Devices (SISPAD), 2013 International Conference on
  • Conference_Location
    Glasgow
  • ISSN
    1946-1569
  • Print_ISBN
    978-1-4673-5733-3
  • Type

    conf

  • DOI
    10.1109/SISPAD.2013.6650579
  • Filename
    6650579