DocumentCode
1987742
Title
Full band calculations of low-field mobility in p-type silicon nanowire MOSFETs
Author
Neophytou, N. ; Stanojevic, Zlatan ; Kosina, Hans
Author_Institution
Inst. for Microelectron., Tech. Univ. Wien, Vienna, Austria
fYear
2013
fDate
3-5 Sept. 2013
Firstpage
81
Lastpage
84
Abstract
The bandstructure of p-type gated Si nanowires (NWs) is calculated self-consistently using the sp3d5s* atomistic tight-binding (TB) model and the 2D Poisson equation. The Boltzmann transport formalism is then used for calculation of the low-field mobility. We show that the bandstructures of NWs in the [110] and [111] transport orientations change as the channel is driven into inversion, which causes a ~50% increase in their intrinsic phonon-limited hole mobility. For short channel MOSFET devices, however, the total mobility is lower that the intrinsic mobility because it is affected by the so-called “ballistic” mobility.
Keywords
Boltzmann equation; MOSFET; band structure; elemental semiconductors; nanowires; semiconductor device models; silicon; tight-binding calculations; 2D Poisson equation; Boltzmann transport formalism; Si; atomistic tight-binding model; ballistic mobility; band structure; full band calculations; intrinsic phonon-limited hole mobility; low-field mobility; p-type silicon nanowire MOSFET; short channel MOSFET devices; transport orientations; Computational modeling; Electrostatics; Logic gates; Mathematical model; Resistance; Silicon; Transistors; “ballistic” mobility; Boltzmann transport; Si nanowires; bandstrucutre; mobility; transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Simulation of Semiconductor Processes and Devices (SISPAD), 2013 International Conference on
Conference_Location
Glasgow
ISSN
1946-1569
Print_ISBN
978-1-4673-5733-3
Type
conf
DOI
10.1109/SISPAD.2013.6650579
Filename
6650579
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