DocumentCode
1987850
Title
Testing of embedded system using fault modeling
Author
Srivastava, Saumya ; Singh, Amit Prakash
Author_Institution
Dept. of Electron. & Commun., Amity Univ., Noida, India
fYear
2009
fDate
22-24 Dec. 2009
Firstpage
177
Lastpage
180
Abstract
This paper deals with the problem of testing methods for testing embedded systems The problem addressed in this paper is about methods for testing whether impletation of system are correct . The problem of testing a system for its correctness deals with the designing of test cases .Test cases for correctness of the system with respect to specifications ,are large in number which makes the testing of embedded system infeasible. Robust testing of embedded system will help in solving this problem .Robust testing can be done by considering specifications as finite state machine.
Keywords
embedded systems; finite state machines; software fault tolerance; embedded system testing; fault modeling; finite state machine; robust testing; Automata; Circuit faults; Electronic equipment testing; Embedded software; Embedded system; Hardware; Information technology; Photonics; Robustness; System testing; FSM; Test suites; faults;
fLanguage
English
Publisher
ieee
Conference_Titel
Emerging Trends in Electronic and Photonic Devices & Systems, 2009. ELECTRO '09. International Conference on
Conference_Location
Varanasi
Print_ISBN
978-1-4244-4846-3
Type
conf
DOI
10.1109/ELECTRO.2009.5441142
Filename
5441142
Link To Document