Title :
Testing of embedded system using fault modeling
Author :
Srivastava, Saumya ; Singh, Amit Prakash
Author_Institution :
Dept. of Electron. & Commun., Amity Univ., Noida, India
Abstract :
This paper deals with the problem of testing methods for testing embedded systems The problem addressed in this paper is about methods for testing whether impletation of system are correct . The problem of testing a system for its correctness deals with the designing of test cases .Test cases for correctness of the system with respect to specifications ,are large in number which makes the testing of embedded system infeasible. Robust testing of embedded system will help in solving this problem .Robust testing can be done by considering specifications as finite state machine.
Keywords :
embedded systems; finite state machines; software fault tolerance; embedded system testing; fault modeling; finite state machine; robust testing; Automata; Circuit faults; Electronic equipment testing; Embedded software; Embedded system; Hardware; Information technology; Photonics; Robustness; System testing; FSM; Test suites; faults;
Conference_Titel :
Emerging Trends in Electronic and Photonic Devices & Systems, 2009. ELECTRO '09. International Conference on
Conference_Location :
Varanasi
Print_ISBN :
978-1-4244-4846-3
DOI :
10.1109/ELECTRO.2009.5441142
