• DocumentCode
    1987850
  • Title

    Testing of embedded system using fault modeling

  • Author

    Srivastava, Saumya ; Singh, Amit Prakash

  • Author_Institution
    Dept. of Electron. & Commun., Amity Univ., Noida, India
  • fYear
    2009
  • fDate
    22-24 Dec. 2009
  • Firstpage
    177
  • Lastpage
    180
  • Abstract
    This paper deals with the problem of testing methods for testing embedded systems The problem addressed in this paper is about methods for testing whether impletation of system are correct . The problem of testing a system for its correctness deals with the designing of test cases .Test cases for correctness of the system with respect to specifications ,are large in number which makes the testing of embedded system infeasible. Robust testing of embedded system will help in solving this problem .Robust testing can be done by considering specifications as finite state machine.
  • Keywords
    embedded systems; finite state machines; software fault tolerance; embedded system testing; fault modeling; finite state machine; robust testing; Automata; Circuit faults; Electronic equipment testing; Embedded software; Embedded system; Hardware; Information technology; Photonics; Robustness; System testing; FSM; Test suites; faults;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Emerging Trends in Electronic and Photonic Devices & Systems, 2009. ELECTRO '09. International Conference on
  • Conference_Location
    Varanasi
  • Print_ISBN
    978-1-4244-4846-3
  • Type

    conf

  • DOI
    10.1109/ELECTRO.2009.5441142
  • Filename
    5441142