Title : 
Pattern matching for case analysis: a computational definition of closeness
         
        
            Author : 
Delisle, Sylvain ; Copeck, Terry ; Szpakowicz, Stan ; Barker, Ken
         
        
            Author_Institution : 
Dept. of Comput. Sci., Ottawa Univ., Ont., Canada
         
        
        
        
        
        
            Abstract : 
Proposes a conceptually and technically neat method to identify known semantic patterns close to a novel pattern. This occurs in the context of a system to acquire knowledge incrementally from systematically processed expository technical text. This semi-automatic system requires the user to respond to specific multiple-choice questions about the current sentence. The questions are prepared from linguistic elements previously encountered in the text similar to elements in the new sentence. We present a metric to characterize the similarity between semantic case patterns. The computation is based on syntactic indicators of semantic relations and is defined in terms of symbolic pattern matching
         
        
            Keywords : 
case-based reasoning; computational linguistics; knowledge acquisition; natural languages; pattern recognition; HAIKU; TANKA project; case analysis; closeness; computational definition; incremental knowledge acquisition; linguistic elements; multiple-choice questions; semantic case patterns; semantic relations; semi-automatic system; sentence; similarity metric; symbolic pattern matching; syntactic indicators; systematically processed expository technical text; Computer aided software engineering; Computer science; Data structures; Impedance matching; Knowledge acquisition; Knowledge representation; Pattern analysis; Pattern matching; Research initiatives; Text analysis;
         
        
        
        
            Conference_Titel : 
Computing and Information, 1993. Proceedings ICCI '93., Fifth International Conference on
         
        
            Conference_Location : 
Sudbury, Ont.
         
        
            Print_ISBN : 
0-8186-4212-2
         
        
        
            DOI : 
10.1109/ICCI.1993.315357