DocumentCode
1988073
Title
New Dynamic Threshold MOS Structures for Low-Energy True-Single-Phase-Clocking Circuits
Author
Wu, Ke ; Jia, Song ; Chen, Zhongjian ; Gan, Xuewen
Author_Institution
Institute of Microelectronics Peking University, Beijing, P. R. China. E-mail: wuke@ime.pku.edu.cn
fYear
2005
fDate
19-21 Dec. 2005
Firstpage
427
Lastpage
430
Abstract
Higher speed and better saving of energy at low voltage can be gain simultaneously by adopting the dynamic threshold MOS circuit. In this paper, a new scheme was proposed by combining True Single Phase Clocking (TSPC) Logic with dynamic threshold technique. In this scheme the thresholds of the NMOS logic or PMOS logic change only when these transistors need to be turned on and keeps high threshold when they are shut down. And the scheme uses the charge recovery technique of the substrate to further reduce power. It is capable of operating at 0.8V or even lower. The proposed scheme is shown to be 33.45% faster and has 20.86% energy savings compared to the regular TSPC logic circuits, during HSPICE simulations. And last this scheme was further improved in speed.
Keywords
CMOS technology; Circuit simulation; Clocks; Dynamic voltage scaling; Explosives; Gallium nitride; Logic circuits; Low voltage; MOS devices; MOSFET circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices and Solid-State Circuits, 2005 IEEE Conference on
Print_ISBN
0-7803-9339-2
Type
conf
DOI
10.1109/EDSSC.2005.1635298
Filename
1635298
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