Title :
Complete X-ray orientation determination of quartz bars using a small scanning range
Author :
Berger, H. ; Bradaczek, H. ; Hildebrandt, G.
Author_Institution :
Res. Center, EFG Int. Berlin, Germany
Abstract :
In order to determine the true AT cutting angle and the XX´ miscutting at the X face perpendicular to the rotation axis of quartz bars, three X-ray diffraction peaks have to be considered. Reflection combinations have been found which can be measured with sufficiently small errors in the relevant angles using two beams incident in two slightly different directions and scanning over a limited angular range in the order of the reflection widths. So, an automated measuring and bar-adjusting process can be established. An example of a suited reflection combination is given, and a corresponding arrangement based on it is proposed
Keywords :
X-ray diffraction; crystal orientation; quartz; AT cutting angle; SiO2; X face; X-ray diffraction; X-ray reflection; XX´ miscutting; crystal orientation; quartz bar; scanning range; Automatic control; Bars; Geometry; Goniometers; Lattices; Optical reflection; Performance evaluation; Position measurement; X-ray diffraction;
Conference_Titel :
Frequency and Time Forum, 1999 and the IEEE International Frequency Control Symposium, 1999., Proceedings of the 1999 Joint Meeting of the European
Conference_Location :
Besancon
Print_ISBN :
0-7803-5400-1
DOI :
10.1109/FREQ.1999.841438
