DocumentCode :
1988200
Title :
Notice of Violation of IEEE Publication Principles
Design of ultra-low power CMOS cells for temperature sensors in VLSI
Author :
Nath, V. ; Kumari, Ruchika ; Das, B.N. ; Gupta, R.N. ; Yadav, K.S. ; Singh, L.K. ; Jeong, Taikyeong Ted
Author_Institution :
Dept. of ECE, Birla Inst. of Technol., Ranchi, India
fYear :
2009
fDate :
22-24 Dec. 2009
Firstpage :
116
Lastpage :
119
Abstract :
Notice of Violation of IEEE Publication Principles

"Design of Ultra-low Power CMOS Cells for Temperature Sensors in VLSI,"
by V. Nath, R. Kumari, B.N. Das, R.N. Gupta, K.S. Yadav, L.K. Singh, T.T. Jeong
in the Proceedings of the International Conference on Emerging Trends in Electronic and Photonic Devices & Systems, 2009. ELECTRO \´09, Dec. 2009, pp. 116-119

After careful and considered review of the content and authorship of this paper by a duly constituted expert committee, this paper has been found to be in violation of IEEE\´s Publication Principles.

This paper is a duplication of the original text from the paper cited below. The original text was copied without attribution (including appropriate references to the original author(s) and/or paper title) and without permission.

Due to the nature of this violation, reasonable effort should be made to remove all past references to this paper, and future references should be made to the following article:

"Ultra-low Power CMOS Cells for Temperature Sensors"
by C. Rossi and P. Aguirre
in the Proceedings of the 18th Annual Symposium on Integrated Circuits and System Design, ACM Press, 2005, pp. 202ߝ206

Temperature sensors and voltage references require cells that generate both PTAT (Proportional to Absolute Temperature) and NTC (Negative Temperature coefficient) voltages. We present a novel theoretical approach based on a quasi-constant current to obtain these voltages in standard CMOS technology using no resistors. These circuits are designed simulated using CADENCE analog and digital system design tools of 0.6 ??m CMOS technology. We performed measurements in a -43??C to 127??C temperature range which verify the expected results. The circuit draws under 50 nA from a 1.0 V to 1.6 V supply.
Keywords :
CMOS integrated circuits; VLSI; temperature sensors; CADENCE analog and digital system design tools; VLSI; current 50 nA; negative temperature coefficient; proportional to absolute temperature; quasi-constant current; size 0.6 mum; temperature -43 degC to 127 degC; temperature sensors; ultra-low power CMOS cells; voltage 1.0 V to 1.6 V; voltage references; CMOS integrated circuits; CMOS technology; Circuit simulation; Notice of Violation; Optoelectronic and photonic sensors; Resistors; Temperature sensors; Very large scale integration; Voltage; CADENCE analog and digital system design tools; CMOS; Current reference; Micropower; Temperature Sensor; Voltage reference;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Emerging Trends in Electronic and Photonic Devices & Systems, 2009. ELECTRO '09. International Conference on
Conference_Location :
Varanasi
Print_ISBN :
978-1-4244-4846-3
Type :
conf
DOI :
10.1109/ELECTRO.2009.5441158
Filename :
5441158
Link To Document :
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