Title :
Characterization of single-port surface transverse wave resonators in the lower GHz range
Author :
Avramov, Ivan D.
Author_Institution :
Inst. of Solid State Phys., Sofia, Bulgaria
Abstract :
This paper presents results from an experimental study on single-port surface transverse wave resonators (STWR) operating in the 1.0 to 2.0 GHz range. The equivalent circuit parameters are extracted in transmission and reflection measurements and compared with data obtained from bulk acoustic wave (BAW) and surface acoustic wave (SAW) based single-port resonators. Operating at much lower frequencies. It is shown that, at GHz frequencies practical single-port STW devices feature extremely low values of the dynamic resistance. On one hand, this results in device Q greatly exceeding the material Q limit for SAW and BAW and on the other hand, it allows the design of simple negative resistance oscillators (NRO) with excellent short term stability, high output power and unprecedented RF/d.c. efficiency
Keywords :
Q-factor; electric admittance; feedback oscillators; frequency response; microwave oscillators; negative resistance circuits; phase noise; surface acoustic wave oscillators; surface acoustic wave resonators; 1 to 2 GHz; Q factor; RF/DC efficiency; complex admittance; dynamic resistance; equivalent circuit parameters; feedback loop oscillators; frequency response; high output power; microwave oscillator applications; phase noise performance; reflection measurements; short term stability; simple negative resistance oscillators; single-port surface transverse wave resonators; transmission measurements; Acoustic measurements; Acoustic reflection; Acoustic waves; Data mining; Electrical resistance measurement; Equivalent circuits; Frequency; Surface acoustic wave devices; Surface acoustic waves; Surface waves;
Conference_Titel :
Frequency and Time Forum, 1999 and the IEEE International Frequency Control Symposium, 1999., Proceedings of the 1999 Joint Meeting of the European
Conference_Location :
Besancon
Print_ISBN :
0-7803-5400-1
DOI :
10.1109/FREQ.1999.841441
