Title :
The design verification module for a SAW design automation system
Author :
McCollister, M.J. ; Richie, S.M.
Author_Institution :
Dept. of Electr. & Comput. Eng., Central Florida Univ., Orlando, FL, USA
Abstract :
This paper presents a stand-alone version of the design verification module for a SAW design automation system. The automation system that is being developed requires a verification phase that will be used to examine S-parameter data from test devices and determine if a specific device meets design requirements. This paper includes the specification and performance data structures, methods of extracting performance data, and methods of verifying performance versus requirements. The algorithms and techniques for efficiently extracting device performance data from experimental data are presented. Techniques including Fourier and wavelet coefficient reduction for parameter extraction are included. The core of the system contains the specification and performance data structures appropriate for SAW bandpass filter devices. The specifications contain the time response constraints, frequency response magnitude and phase, and delay constraints. Performance data is extracted from measured or calculated S-parameters as a function of frequency. This data is compared with the design requirements to see if a device meets these specifications. If a device fails, the device parameters that caused the failure are identified. All performance failures can be used as a basis for design corrections. The algorithms and programs developed in this paper will be available via the Internet at http://pegasus.cc.ucf.edu/-mjm05082/fcs1999/
Keywords :
Fourier transforms; S-parameters; band-pass filters; electronic design automation; frequency response; surface acoustic wave filters; wavelet transforms; Fourier coefficient reduction; S-parameter data; SAW design automation system; bandpass filter devices; delay constraints; design verification module; device performance data; frequency response magnitude; performance data structures; performance failures; phase constraint; time response constraints; verification phase; wavelet coefficient reduction; Automatic testing; Band pass filters; Data mining; Data structures; Design automation; Parameter extraction; Scattering parameters; Surface acoustic waves; System testing; Wavelet coefficients;
Conference_Titel :
Frequency and Time Forum, 1999 and the IEEE International Frequency Control Symposium, 1999., Proceedings of the 1999 Joint Meeting of the European
Conference_Location :
Besancon
Print_ISBN :
0-7803-5400-1
DOI :
10.1109/FREQ.1999.841448