• DocumentCode
    1988635
  • Title

    The use of design of experiments for the optimization of deposited glass on SAW filters

  • Author

    Hickernell, F.S. ; Knuth, H.D.

  • Author_Institution
    Syst. Solutions Group, Motorola Inc., Scottsdale, AZ, USA
  • Volume
    2
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    950
  • Abstract
    Vacuum deposited glass layers on piezoelectric crystals have been effectively used to improve the performance properties of surface acoustic wave (SAW) filters. These include, reducing the temperature coefficient of frequency, increasing the coupling factor, frequency trimming, and surface passivation for improved wafer yield. Using an orthogonal design of experiments (DOE) procedure, based upon a set of 9 experiments, the influence of process parameters on SAW properties were determined for RF diode sputtered glass on 128° Y-X lithium niobate. The glass was sputtered to a thickness around 600 nm for each experiment. There were four dependent sputter system variables, substrate temperature, background sputter gas pressure, RF power to the target, and gas flow rate. Three independent properties were measured, film stress, SAW velocity, and SAW propagation loss. The work is illustrative of a technique for optimizing the deposition conditions for films on SAW substrates using a minimum number of experiments. The DOE procedure can be applied to any combination of film and substrate with the results dependent upon the limits of the vacuum equipment and deposition technique used
  • Keywords
    design of experiments; glass; lithium compounds; losses; optimisation; passivation; sputter deposition; sputtered coatings; surface acoustic wave filters; 600 nm; LiNbO3; RF diode sputtered glass on LiNbO3; RF power; SAW propagation loss; SAW properties; SAW substrates; SAW velocity; background sputter gas pressure; coupling factor; dependent sputter system variables; deposited glass on SAW filters; deposition conditions; design of experiments; film stress; filter optimization; frequency trimming; gas flow rate; orthogonal DOE procedure; piezoelectric crystals; process parameters; substrate temperature; surface acoustic wave filters; surface passivation; temperature coefficient of frequency; vacuum deposited glass layers; wafer yield improvement; Acoustic waves; Crystals; Design optimization; Filters; Glass; Radio frequency; Substrates; Surface acoustic waves; Temperature; US Department of Energy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frequency and Time Forum, 1999 and the IEEE International Frequency Control Symposium, 1999., Proceedings of the 1999 Joint Meeting of the European
  • Conference_Location
    Besancon
  • ISSN
    1075-6787
  • Print_ISBN
    0-7803-5400-1
  • Type

    conf

  • DOI
    10.1109/FREQ.1999.841461
  • Filename
    841461