Title :
Simulation of terahertz plasmons in graphene with grating-gate structures
Author :
Satou, Akira ; Ryzhii, Victor ; Otsuji, Taiichi ; Vasko, F.T. ; Mitin, V.V.
Author_Institution :
Res. Inst. of Electr. Commun., Tohoku Univ., Sendai, Japan
Abstract :
Frequency dispersion and damping mechanisms of two-dimensional plasmons in graphene in the terahert (THz) range are studied by a numerical simulation based on the Boltzmann equation. The fundamental plasmon mode in a singlegrating-gate structure is studied, and the coupling effect of plasmons in the gated and ungated regions are revealed. It is shown that the plasmon frequency as well as its gate-voltage tunability depend strongly on the coupling. It is also demonstrated that damping rates due to the acoustic-phonon scattering at room temperature and short- and finite-range disorder scattering can be on the order of 1011 s-1, depending on the level of disorders.
Keywords :
Boltzmann equation; graphene; numerical analysis; phonons; plasmons; Boltzmann equation; C; acoustic-phonon scattering; damping mechanisms; finite-range disorder scattering; frequency dispersion; fundamental plasmon mode; gate-voltage tunability; graphene; numerical simulation; plasmon coupling effect; plasmon frequency; short-range disorder scattering; single-grating-gate structure; temperature 293 K to 298 K; terahertz plasmons; two-dimensional plasmons; Couplings; Damping; Graphene; Logic gates; Periodic structures; Plasmons; Scattering;
Conference_Titel :
Simulation of Semiconductor Processes and Devices (SISPAD), 2013 International Conference on
Conference_Location :
Glasgow
Print_ISBN :
978-1-4673-5733-3
DOI :
10.1109/SISPAD.2013.6650624