Title :
False write through and un-restored write electrical level fault models for SRAMs
Author :
Adams, R. Dean ; Cooley, Edmond S.
Author_Institution :
Dartmouth´´s Thayer Sch. of Eng., Hanover, NH, USA
Abstract :
Static random access memory fault modeling typically is done at the functional level of abstraction. Electrical level simulations, however, demonstrate real fault models which were previously overlooked. False write through and un-restored write fault models are introduced. Two patterns are defined to identify such faults. Further benefits of electrical level fault modeling are discussed
Keywords :
SRAM chips; fault diagnosis; integrated circuit modelling; integrated circuit testing; SRAMs; electrical level fault models; false write through; fault modeling; functional level; un-restored write; Circuit faults; Circuit testing; Circuit topology; Coupling circuits; Fault detection; Microprocessors; Random access memory; SRAM chips; Solid modeling; Test pattern generators;
Conference_Titel :
Memory Technology, Design and Testing, 1997. Proceedings., International Workshop on
Conference_Location :
San Jose, CA
Print_ISBN :
0-8186-8099-7
DOI :
10.1109/MTDT.1997.619391