Title :
Image reconstruction method for electrical capacitance tomography based on C-support vector machine algorithm
Author :
Han, Yuhui ; Han, Bing ; Shen, Lili ; Li, Zhaoyu
Author_Institution :
Henan Eng. Center of Autom., Zhengzhou, China
Abstract :
Electrical capacitance tomography (ECT) is a typical small samples and nonlinear mapping problem. Support vector machine (SVM) is based on the special small samples theory with strong generalization ability, and is selected as an optimal theory for small samples classify problem. In this paper the ECT image reconstruction algorithms based on C-S VM is proposed and a novel training method is proposed to improve the efficiency of C-SVM classifier by selecting active penalty parameters. The simulation and experiment indicates this algorithm has the stronger space resolution and generalization ability.
Keywords :
computerised tomography; image classification; image reconstruction; support vector machines; C-SVM classifier; active penalty parameter; c-support vector machine; electrical capacitance tomography; generalization ability; image reconstruction method; special small samples theory; Algorithm design and analysis; Capacitance; Classification algorithms; Electrical capacitance tomography; Image reconstruction; Instruments; Support vector machines; electrical capacitance tomography; generalization ability; image reconstruction; space resolution; support vector machine;
Conference_Titel :
Electrical and Control Engineering (ICECE), 2011 International Conference on
Conference_Location :
Yichang
Print_ISBN :
978-1-4244-8162-0
DOI :
10.1109/ICECENG.2011.6057819