Title :
A trench lateral power MOSFET using self-aligned trench bottom contact holes
Author :
Fujishima, N. ; Salama, C.A.T.
Author_Institution :
Dept. of Electr. & Comput. Eng., Toronto Univ., Ont., Canada
Abstract :
A novel Trench Lateral Power MOSFET (T-LPM) structure and its fabrication process are presented in this paper. The gate, channel, and the drift region are built on the side-wall of the trench. The process uses self-aligned trench bottom contact holes to the drain to achieve minimum pitch and very low on-resistance. A T-LPM, with 80 V breakdown voltage, has a cell pitch of 4 /spl mu/m which is about half that of the Conventional Lateral Power MOSFETs (C-LPM). The specific on-resistances for the T-LPM and C-LPM are 0.8 m/spl Omega/-cm/sup 2/ and 1.6 m/spl Omega/-cm/sup 2/ respectively for a 80 V breakdown.
Keywords :
power MOSFET; semiconductor technology; 80 V; T-LPM; breakdown voltage; cell pitch; fabrication; on-resistance; self-aligned trench bottom contact holes; trench lateral power MOSFET; Electric breakdown; Electrodes; Etching; Fabrication; Impedance; MOSFET circuits; Plugs; Power MOSFET; Power integrated circuits; Silicon;
Conference_Titel :
Electron Devices Meeting, 1997. IEDM '97. Technical Digest., International
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-7803-4100-7
DOI :
10.1109/IEDM.1997.650399