• DocumentCode
    1989567
  • Title

    A trench lateral power MOSFET using self-aligned trench bottom contact holes

  • Author

    Fujishima, N. ; Salama, C.A.T.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Toronto Univ., Ont., Canada
  • fYear
    1997
  • fDate
    10-10 Dec. 1997
  • Firstpage
    359
  • Lastpage
    362
  • Abstract
    A novel Trench Lateral Power MOSFET (T-LPM) structure and its fabrication process are presented in this paper. The gate, channel, and the drift region are built on the side-wall of the trench. The process uses self-aligned trench bottom contact holes to the drain to achieve minimum pitch and very low on-resistance. A T-LPM, with 80 V breakdown voltage, has a cell pitch of 4 /spl mu/m which is about half that of the Conventional Lateral Power MOSFETs (C-LPM). The specific on-resistances for the T-LPM and C-LPM are 0.8 m/spl Omega/-cm/sup 2/ and 1.6 m/spl Omega/-cm/sup 2/ respectively for a 80 V breakdown.
  • Keywords
    power MOSFET; semiconductor technology; 80 V; T-LPM; breakdown voltage; cell pitch; fabrication; on-resistance; self-aligned trench bottom contact holes; trench lateral power MOSFET; Electric breakdown; Electrodes; Etching; Fabrication; Impedance; MOSFET circuits; Plugs; Power MOSFET; Power integrated circuits; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1997. IEDM '97. Technical Digest., International
  • Conference_Location
    Washington, DC, USA
  • ISSN
    0163-1918
  • Print_ISBN
    0-7803-4100-7
  • Type

    conf

  • DOI
    10.1109/IEDM.1997.650399
  • Filename
    650399