Title :
Flicker noise measurement of HF quartz resonators
Author :
Groslambert, J. ; Giordano, V. ; Brunet, M. ; Rubiola, E.
Author_Institution :
Lab. de Phys. et Metrol. des Oscillateurs, CNRS, Besancon, France
Abstract :
The frequency flicker of quartz resonators can be derived from the measurement of Sφ(f), i.e. the power spectrum density of phase fluctuations φ. Besides, the interferometric method turns out to be the best choice to measure the quartz resonator phase fluctuations because of its high sensitivity even in the low power conditions required for these devices. Combining these two ideas, we built an instrument suitable to measure the resonator frequency flicker floor and we measured the stability of some 10 MHz high performances resonators as a function of the dissipated power. The stability limit of our instrument, described in terms of Allan deviation σy(τ), is of some 10-14
Keywords :
crystal resonators; electric noise measurement; electromagnetic wave interferometry; flicker noise; frequency stability; 10 MHz; Allan deviation; HF quartz resonators; dissipated power; flicker noise measurement; interferometric method; phase fluctuations; power spectrum density; resonator frequency flicker floor; stability; stability limit; 1f noise; Fluctuations; Frequency measurement; Hafnium; Instruments; Noise measurement; Phase measurement; Power measurement; Resonant frequency; Stability;
Conference_Titel :
Frequency and Time Forum, 1999 and the IEEE International Frequency Control Symposium, 1999., Proceedings of the 1999 Joint Meeting of the European
Conference_Location :
Besancon
Print_ISBN :
0-7803-5400-1
DOI :
10.1109/FREQ.1999.841549
