Title :
A New Type and Facile Measuring System of Soil Roughness
Author :
Haiping, Lu ; Chunliang, Xu ; Mingquan, Jia ; Yan, Chen
Author_Institution :
Sch. of Phys. Electron., UESTC, Chengdu
Abstract :
A practical and convenient system is put forward in this paper to obtain the roughness parameter of soil surface profile correctly. Its composing, workflow were introduced, the feasibility was demonstrated, and the calculated data was analyzed. After theoretical analysis and verification, the system was proved to performance good, and can calculate the roughness parameters of samples accurately.
Keywords :
microwave measurement; remote sensing; soil; facile measuring system; microwave backscattering; remote sensing; soil roughness; soil surface profile; Backscatter; Cameras; Instruments; Needles; Rough surfaces; Sampling methods; Scattering; Soil measurements; Steel; Surface roughness; correlation length; soil roughness;
Conference_Titel :
Education Technology and Training, 2008. and 2008 International Workshop on Geoscience and Remote Sensing. ETT and GRS 2008. International Workshop on
Conference_Location :
Shanghai
Print_ISBN :
978-0-7695-3563-0
DOI :
10.1109/ETTandGRS.2008.116
