Title :
A Novel Waveguide Transistor Noise Measurement System
Author :
Ebner, H. ; Opfer, J.
Author_Institution :
Institut fÿr Hochfrequenztechnik, RWTH Aachen, Aachen, Germany
Abstract :
An accurate, semi-automatic transistor noise measurement scheme for mm-wave applications is presented. The method is based on the determination of the transistor noise equivalent circuit parameters by regression techniques.
Keywords :
Acoustic reflection; Application software; Circuit noise; Computer errors; Equivalent circuits; Fluctuations; Matrices; Noise generators; Noise measurement; Transmission line matrix methods;
Conference_Titel :
Microwave Conference, 1984. 14th European
Conference_Location :
Liege, Belgium
DOI :
10.1109/EUMA.1984.333356
