New sensitivity normalization in electrical tomography

Author

Wang, Zhanjun ; Li, Liu

Author_Institution

Dept. of Comput. & Math. Teaching, Shenyang Normal Univ., Shenyang, China

fYear

2011

fDate

16-18 Sept. 2011

Firstpage

1129

Lastpage

1132

Abstract

Due to the shortcoming of linear normalization for sensitivity in electrical tomography system, nonlinear formulas are derived about electrical resistance tomography (ERT), capacitance tomography (ECT) and electromagnetic tomography (EMT). Those formulas are deduced according to the characteristics of analytical solution and system structure. The role of normalization in data processing is introduced. Logarithmic normalization formula is summarized for ERT. In ECT, parallel model and serial model are introduced, and nonlinear formulas are described depending on real distribution in object field. Mainly, special normalization formula is deduced.

Keywords

computerised tomography; capacitance tomography; data processing; electrical resistance tomography; electromagnetic tomography; linear normalization; logarithmic normalization formula; object field; real distribution; sensitivity normalization; Capacitance; Educational institutions; Electrical capacitance tomography; Instruments; Sensitivity; electrical tomography; normalization; sensitivity;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical and Control Engineering (ICECE), 2011 International Conference on

Conference_Location

Yichang

Print_ISBN

978-1-4244-8162-0

Type

conf

DOI

10.1109/ICECENG.2011.6057872

Filename

6057872