DocumentCode :
1990784
Title :
Defect deconvolution using 3rd order statistics for Ultrasonic Nondestructive Testing
Author :
Qidwai, Uvais ; Bettayeb, Maamar ; Yamani, Ahmed
Author_Institution :
Dept. of Comput. Sci. & Eng., Qatar Univ., Doha
fYear :
2007
fDate :
12-15 Feb. 2007
Firstpage :
1
Lastpage :
4
Abstract :
Ultrasonic nondestructive testing (NDT) is primarily based upon the detection and classification of a defect in the field of industrial materials. This information is useful in making administrative decisions in terms of maintenance and replacement. The technique presented in this paper utilizes the concept of defect induction as a convolution process between the clean sample and the defect signature. Hence, to identify the type of defect a deconvolution approach can be useful. Due to several similarities between the ultrasonic echoes and the usual modulated sinusoids, a motivation is present to use 2nd and higher order statistics for completely defining the waveform. Such a definition, when compared with standard defects, will provide useful insight in terms of defect classifications and understanding.
Keywords :
deconvolution; flaw detection; higher order statistics; signal classification; ultrasonic materials testing; 3rd order statistics; clean sample; convolution process; defect classification; defect deconvolution; defect detection; defect induction; defect signature; industrial materials; modulated sinusoids; ultrasonic echoes; ultrasonic nondestructive testing; Acoustic noise; Additive noise; Deconvolution; Gaussian noise; Higher order statistics; Instruments; Materials testing; Nondestructive testing; Random processes; Signal processing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Signal Processing and Its Applications, 2007. ISSPA 2007. 9th International Symposium on
Conference_Location :
Sharjah
Print_ISBN :
978-1-4244-0778-1
Electronic_ISBN :
978-1-4244-1779-8
Type :
conf
DOI :
10.1109/ISSPA.2007.4555603
Filename :
4555603
Link To Document :
بازگشت