Title :
Investigation on nonlinear distortion of acoustic devices for radio-frequency applications and its supression
Author :
Ueda, Masanori ; Iwaki, Masafumi ; Nishihara, Tokihiro ; Satoh, Yoshio ; Hashimoto, Ken-Ya
Author_Institution :
Satoh Fellow Group, Fujitsu Labs. Ltd., Akashi, Japan
Abstract :
In this paper, we discuss the nonlinear performance difference between surface acoustic wave (SAW) and bulk acoustic wave (BAW) resonators, which are inter-modulation-distortion (IMD) and triple-beat (TB) products, and indicate the importance to reduce even-order nonlinearity of BAW resonator. Then, we were able to validate the accuracy and efficiency of our proposed simulation technique on BAW devices by comparing our simulation with experimental data. We verified that our circuit model is a high-performance tool that can be used to predict BAW device nonlinearities. Finally, we produced the thin film bulk acoustic resonator (FBAR) duplexer with highly linear performances for wideband code division multiple access (WCDMA) band 1.
Keywords :
bulk acoustic wave devices; code division multiple access; intermodulation distortion; nonlinear acoustics; radiofrequency oscillators; surface acoustic wave resonators; thin film devices; BAW device nonlinearity prediction; BAW devices; BAW resonators; FBAR duplexer; SAW resonators; WCDMA band 1; acoustic device nonlinear distortion; bulk acoustic wave resonators; circuit model; even order nonlinearity reduction; intermodulation distortion products; nonlinear performance difference; radiofrequency applications; simulation technique; surface acoustic wave resonators; thin film bulk acoustic resonator; triple beat products; wideband code division multiple access; Acoustic devices; Acoustic waves; Bulk acoustic wave devices; Circuit simulation; Multiaccess communication; Nonlinear distortion; Predictive models; Radio frequency; Surface acoustic wave devices; Surface acoustic waves; BAW; FBAR; SAW; duplexer; nonlinearity;
Conference_Titel :
Ultrasonics Symposium (IUS), 2009 IEEE International
Conference_Location :
Rome
Print_ISBN :
978-1-4244-4389-5
Electronic_ISBN :
1948-5719
DOI :
10.1109/ULTSYM.2009.5441402
