Title :
Extraction of Pt/Rh/ZrO2 high temperature elastic constants
Author :
Gallimore, Dana ; Moonlight, Thomas ; Da Cunha, Mauricio Pereira
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Maine, Orono, ME, USA
Abstract :
A recently developed thin Pt/Rh/ZrO2 film has been successfully used as electrode material for high temperature acoustic wave device applications up to 1000°C. In order to accurately model and design high temperature acoustic wave devices, the elastic properties of the Pt/Rh/ZrO2 film are required. In this work, a surface acoustic wave (SAW) method is developed to extract the elastic constants of a co-deposited Pt/Rh/ZrO2 thin film both before and after annealing at 850°C. SAW delay lines are fabricated on multiple langasite (LGS) orientations with Pt/Rh/ZrO2 metalized delay paths. The group velocity of each delay line is measured and input into the matrix method for SAWs in order to extract the independent elastic constants c11 and c44 of the thin film. Preliminary values of the Pt/Rh/ZrO2 elastic constants before and after annealing are reported here for the first time. Elastic constants for the unannealed film vary from the platinum constants by 48% in c44 and 12% in c11. These results reveal the importance of characterizing this new film in order to apply it in the design of high temperature acoustic wave devices.
Keywords :
acoustic measurement; annealing; dielectric thin films; elastic constants; platinum; rhodium; surface acoustic wave delay lines; zirconium compounds; Pt-Rh-ZrO2; SAW method; annealing; codeposition; delay line; elastic constant extraction; electrode material; group velocity; high temperature acoustic wave device; high temperature elastic constant; langasite orientation; surface acoustic wave method; temperature 850 degC; thin film; Acoustic materials; Acoustic waves; Annealing; Delay lines; Electrodes; Surface acoustic wave devices; Surface acoustic waves; Temperature; Transistors; Velocity measurement; Pt/Rh/ZrO2 elastic properties; high temperature electrodes; thin film characterization;
Conference_Titel :
Ultrasonics Symposium (IUS), 2009 IEEE International
Conference_Location :
Rome
Print_ISBN :
978-1-4244-4389-5
Electronic_ISBN :
1948-5719
DOI :
10.1109/ULTSYM.2009.5441410