DocumentCode
1991295
Title
Analysis of additional surface mechanical features in micro-acoustic devices - A combined FEM-JTFA approach
Author
Matthews, Glenn I. ; Baghai-Wadji, Alireza
Author_Institution
Electr. & Comput. Eng., RMIT Univ., Melbourne, VIC, Australia
fYear
2009
fDate
20-23 Sept. 2009
Firstpage
2676
Lastpage
2679
Abstract
In this paper, we propose a hybrid method for the analysis of mechanical features added to the surface of micro-acoustic devices. The proposed technique has been successfully applied to evaluate the influence of additional elastic protective barriers (EPBs) placed on the otherwise planar surface of an 128°YX-LiNbO3 Surface Acoustic Wave (SAW) device. The developed technique is based on the application of the Finite Element Method (FEM), followed by a problem-adapted Joint Time-Frequency Analysis (JTFA). The combined approach simultaneously considers the micro-acoustic device response in both time and frequency domains, thereby providing a comprehensive understanding of underlying physics. The technique is shown to be more sensitive to higher-order effects such as electromagnetic feedthrough than traditional methods. Furthermore, the proposed technique can be employed to assist in the design of SAW structures where protective barriers can be used to generate constructive interference, enhancing device response.
Keywords
finite element analysis; lithium compounds; micromechanical devices; surface acoustic wave devices; time-frequency analysis; LiNbO3; additional elastic protective barriers; additional surface mechanical features; combined FEM-JTFA approach; constructive interference; electromagnetic feedthrough; finite element method; higher-order effects; joint time-frequency analysis; microacoustic devices; surface acoustic wave device; Acoustic waves; Finite element methods; Frequency domain analysis; Interference; Physics; Protection; Surface acoustic wave devices; Surface acoustic waves; Time factors; Time frequency analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Ultrasonics Symposium (IUS), 2009 IEEE International
Conference_Location
Rome
ISSN
1948-5719
Print_ISBN
978-1-4244-4389-5
Electronic_ISBN
1948-5719
Type
conf
DOI
10.1109/ULTSYM.2009.5441420
Filename
5441420
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