DocumentCode :
1991610
Title :
Concurrent error detection in self-timed VLSI
Author :
Rennels, D.A. ; Hyeongil Kim
Author_Institution :
Comput. Sci. Dept., California State Univ., Los Angeles, CA, USA
fYear :
1994
fDate :
15-17 June 1994
Firstpage :
96
Lastpage :
105
Abstract :
This paper examines architectural techniques for providing concurrent error detection in self-timed VLSI pipelines. Signal pairs from Differential Cascode Voltage Switch Logic are compared with a checker that is composed of a tree of dual-rail (morphic) comparators to detect errors and signal completion. An efficient implementation is shown that compares favorably in speed and area with conventional completion signal generators. A simple pipeline is examined with error checkers at each computation stage and hand-shaking control circuits that are modified to improve error detection. Its error-detecting properties are discussed, and preliminary error simulation results are presented. Based on these studies we have concluded that self-timed logic offers considerable fault-tolerance potential due to its built-in redundancy that can be effectively exploited for error checking.<>
Keywords :
VLSI; circuit reliability; error detection; integrated circuit testing; logic testing; built-in redundancy; concurrent error detection; differential cascode voltage switch logic; dual-rail comparators; error checkers; error detection; error simulation; error-detecting properties; fault-tolerance potential; hand-shaking control circuits; pipeline; self-timed VLSI; self-timed logic; signal pairs; Circuits; Computational modeling; Error correction; Logic; Pipelines; Signal detection; Signal generators; Switches; Very large scale integration; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Fault-Tolerant Computing, 1994. FTCS-24. Digest of Papers., Twenty-Fourth International Symposium on
Conference_Location :
Austin, TX, USA
Print_ISBN :
0-8186-5520-8
Type :
conf
DOI :
10.1109/FTCS.1994.315653
Filename :
315653
Link To Document :
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