Title :
Neutron cross-section of N-modular redundancy technique in SRAM-based FPGAs
Author :
Tarrillo, Jimmy ; Lima Kastensmidt, Fernanda ; Rech, P. ; Frost, Christopher ; Valderrama, Carlos
Author_Institution :
Inst. de Inf. - PPGC - PGMICRO, Univ. Fed. do Rio Grande do Sul, Porto Alegre, Brazil
Abstract :
This paper evaluates different trade-offs of N-modular redundancy technique in SRAM-based FPGAs. Redundant copies of the same module were implemented and the outputs voted by self-adapted majority voter. The redundant design was exposed to neutrons and the error rate was evaluated. Results in cross-section, area and power consumption were analyzed for different numbers of redundant modules, ranging from 3 copies (standard TMR) up to 7 copies.
Keywords :
SRAM chips; fault tolerance; field programmable gate arrays; redundancy; N-modular redundancy technique; SRAM-based FPGA; neutron cross-section; self-adapted majority voter; Circuit faults; Field programmable gate arrays; Neutrons; Power demand; Redundancy; Tunneling magnetoresistance; Fault tolerance; N-modular redundancy; SRAM-based FPGAs;
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2013 14th European Conference on
Conference_Location :
Oxford
DOI :
10.1109/RADECS.2013.6937377
