• DocumentCode
    1992044
  • Title

    Scrutinizing graphene with polarized Raman spectroscopy

  • Author

    Huang, Cheng-Wen ; Liu, Chih-Yi ; Shiue, Ren-Jye ; Wang, Wei-Hua ; Wang, Juen-Kai ; Chui, Hsiang-Chen

  • Author_Institution
    Inst. of Electro-Opt. Sci. & Eng., Nat. Cheng Rung Univ., Tainan, Taiwan
  • fYear
    2011
  • fDate
    Aug. 28 2011-Sept. 1 2011
  • Firstpage
    2120
  • Lastpage
    2121
  • Abstract
    The authors report polarized Raman measurement of single-layer graphene. The G peak position shows polarization dependence, because of the stress on the sample. The relation between the local stress and the polarization will be discussed.
  • Keywords
    Raman spectroscopy; graphene; polarized Raman measurement; polarized Raman spectroscopy; single-layer graphene; Educational institutions; Measurement by laser beam; Optical films; Optical imaging; Optical polarization; Raman scattering; Strain;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quantum Electronics Conference & Lasers and Electro-Optics (CLEO/IQEC/PACIFIC RIM), 2011
  • Conference_Location
    Sydney, NSW
  • Print_ISBN
    978-1-4577-1939-4
  • Type

    conf

  • DOI
    10.1109/IQEC-CLEO.2011.6194033
  • Filename
    6194033
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1992044