DocumentCode :
1992127
Title :
Efficient mitigation of data and control flow errors in microprocessors
Author :
Parra, Lucas ; Lindoso, A. ; Portela, Marta ; Entrena, L. ; Restrepo-Calle, Felipe ; Cuenca-Asensi, Sergio ; Martinez-Alvarez, Antonio
Author_Institution :
Electron. Technol. Dept., Univ. Carlos III of Madrid, Leganes, Spain
fYear :
2013
fDate :
23-27 Sept. 2013
Firstpage :
1
Lastpage :
4
Abstract :
The use of microprocessor-based systems is gaining importance in application domains where safety is a must. For this reason, there is a growing concern about the mitigation of SEU and SET effects. This paper presents a new hybrid technique aimed to protect both the data and the control-flow of embedded applications running on microprocessors. On one hand, the approach is based on software redundancy techniques for correcting errors produced in the data. On the other hand, control-flow errors can be detected by reusing the on-chip debug interface, existing in most modern microprocessors. Experimental results show an important increase in the system reliability even superior to two orders of magnitude, in terms of mitigation of both SEUs and SETs. Furthermore, the overheads incurred by our technique can be perfectly assumable in low-cost systems.
Keywords :
error correction; microprocessor chips; radiation hardening (electronics); SET effect mitigation; SEU effect mitigation; control flow errors; efficient data mitigation; error correction; low-cost systems; microprocessor-based systems; on-chip debug interface; software redundancy techniques; system reliability; Clocks; Finite impulse response filters; Hardware; Microprocessors; Redundancy; Registers; Software; Single Event Transient; Single Event Upset; fault tolerance; microprocessor; soft error;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2013 14th European Conference on
Conference_Location :
Oxford
Type :
conf
DOI :
10.1109/RADECS.2013.6937381
Filename :
6937381
Link To Document :
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