Title :
Study of manufacturing variations impact on TID-ATREEs synergistic effect in LM124 operational amplifier
Author :
Roig, Fabien ; Dusseau, L. ; Ribeiro, P. ; Auriel, G. ; Roche, Nicholas J.-H ; Privat, A. ; Vaille, J.-R. ; Boch, J. ; Saigne, F. ; Marec, R. ; Calvel, P. ; Bezerra, F. ; Ecoffet, R. ; Azais, Bruno
Author_Institution :
Commissariat a l´Energie Atomique et aux Energies Alternatives, Gramat, France
Abstract :
The impact of different manufacturing process and designs on the TID-ATREEs synergistic effect is investigated in the LM124 operational amplifier (opamp) from three different manufacturers. Significant variations were observed on both the Total Ionizing Dose (TID) sensitivity and the Analog Transient Effects on Electronics Effects (ATREE) responses of LM124 devices from different manufacturer. The ATREEs are produced by high dose-rate X-ray pulses using a flash X-ray facility. ATREE modeling results were performed using a previously developed simulation tool.
Keywords :
X-ray effects; operational amplifiers; transients; LM124 opamp; LM124 operational amplifier; TID-ATREEs synergistic effect; analog transient effects; dose rate X-ray pulse; flash X-ray facility; manufacturing variation; total ionizing dose sensitivity; Integrated circuit modeling; Operational amplifiers; Predictive models; Radiation effects; Sensitivity; Shape; Transient analysis; Bipolar analog integrated circuits; X-ray effects; circuit modeling; ionizing dose; transient response;
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2013 14th European Conference on
Conference_Location :
Oxford
DOI :
10.1109/RADECS.2013.6937386
