Title :
Investigating the impact of propagation paths and re-convergent paths on the propagation induced pulse broadening
Author :
Hamad, Ghaith Bany ; Hasan, Syed Rafay ; Mohamed, O. Ait ; Savaria, Yvon
Author_Institution :
Groupe de Rech. en Microelectron. et Microsystemes, Polytech. Montreal, Montréal, QC, Canada
Abstract :
A new investigation of the dependence of the Single Event Transient (SET) pulse broadening on the input pattern i.e. fan-in, propagation paths, pulse polarity and re-convergent paths is presented. Worst and best SET pulse propagation paths are identified.
Keywords :
radiation hardening (electronics); SET pulse propagation paths; fan-in; propagation induced pulse broadening; pulse polarity; re-convergent paths; single event transient pulse broadening; Analytical models; Attenuation; CMOS integrated circuits; Integrated circuit modeling; Logic gates; Semiconductor device modeling; Single event transients; Broadening; Input pattern; PIPB; SET; Soft error;
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2013 14th European Conference on
Conference_Location :
Oxford
DOI :
10.1109/RADECS.2013.6937387
