Title :
Total dose and single event effects testing of the Intersil ISL70003SEH integrated point of load converter
Author :
van Vonno, N.W. ; White, J.D. ; Hood, R.A. ; Reingraber, M.A. ; Pearce, L.G. ; Thomson, E.J.
Author_Institution :
Precision Products, Intersil Corp., Palm Bay, FL, USA
Abstract :
We report results of destructive and nondestructive SEE testing and total dose testing of the ISL70003SEH integrated point of load (POL) converter, together with a discussion of the part´s electrical specifications and fabrication process.
Keywords :
convertors; power MOSFET; radiation hardening (electronics); ISL70003SEH integrated point of load converter; Intersil ISL70003SEH integrated point; single event effects testing; total dose testing; Capacitors; Gold; Ions; Regulators; Testing; Transient analysis; Voltage control;
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2013 14th European Conference on
Conference_Location :
Oxford
DOI :
10.1109/RADECS.2013.6937392
