Title :
SRAMs SEL and SEU in-flight data from PROBA-II spacecraft
Author :
D´Alessio, M. ; Poivey, C. ; Ferlet-Cavrois, Veronique ; Evans, Hugh ; Harboe-Sorensen, R. ; Keating, Ana ; Lopez-Calle, I. ; Guerre, F.X. ; Lochon, Frederic ; Santandrea, S. ; Zadeh, Ali ; Muschitiello, Michele ; Markgraf, M. ; Montenbruck, O. ; Grillenb
Author_Institution :
Eur. Space Agency, Noordwijk, Netherlands
Abstract :
This paper presents an analysis of the SEE in-flight data of SRAMs on board Proba-II spacecraft. Proba-II spacecraft has been flying on a LEO orbit for more than 3 years. Observed in-flight error rates are compared with predictions based on ground test data.
Keywords :
SRAM chips; radiation hardening (electronics); space vehicle electronics; LEO orbit; Proba-II spacecraft; SEE in-flight data; SEU in-flight data; SRAM; ground test data; observed in-flight error rates; Global Positioning System; Monitoring; Protons; Random access memory; Temperature measurement; Temperature sensors; Time division multiplexing; Single Event Effect (SEE); Single Event Latch-up (SEL); Single Event Upset (SEU); Static Random Access Memory (SRAM); hardness assurance; radiation experiment; radiation monitor; technology demonstration;
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2013 14th European Conference on
Conference_Location :
Oxford
DOI :
10.1109/RADECS.2013.6937398
