DocumentCode
1992515
Title
Material and resonator design dependant loss in langasite bulk acoustic wave resonators at high temperatures
Author
Schulz, Michal ; Richter, Denny ; Fritze, Holger
Author_Institution
LaserApplicationCenter, Clausthal Univ. of Technol., Goslar, Germany
fYear
2009
fDate
20-23 Sept. 2009
Firstpage
1676
Lastpage
1679
Abstract
Single crystalline langasite (La3Ga5SiO14) resonators exhibit piezoelectrically exited bulk acoustic waves up to temperatures close to its melting point at 1470°C. The loss observed in bulk acoustic wave devices depends on the materials properties and the resonance frequency. Anticipated operation at extremely high temperatures requires the understanding of both influences and enables tailoring of both properties to reduce the loss. Electrical impedance spectroscopy and diffusion runs using stable isotopes are the key methods used to study the atomistic transport processes and the electromechanical properties of langasite. At elevated temperatures, electrical as well as mechanical loss contributions are found. In particular, oxygen vacancies are responsible for strong losses which can be, however, suppressed by light donor doping. Above 650°C, the impact of the conductivity related loss becomes pronounced. Further, the coupling of mechanical and electrical properties due to the piezoelectric effect causes a loss maximum at the dielectric relaxation frequency. Doping of langasite modifies the electrical conductivity and shifts, thereby, the dielectric relaxation frequency. Consequently, the choice of appropriate dopants and/or of the resonance frequency far off the latter frequency minimizes the loss. The concept is demonstrated and leads to an improved performance of resonant sensors at high temperatures.
Keywords
acoustic resonators; bulk acoustic wave devices; crystal resonators; dielectric losses; dielectric relaxation; electrical conductivity; lanthanum compounds; piezoelectricity; La3Ga5SiO14; atomistic transport processes; dielectric relaxation frequency; diffusion; doping; electrical conductivity; electrical impedance spectroscopy; electrical loss; electromechanical properties; langasite bulk acoustic wave resonators; material dependent loss; mechanical loss; oxygen vacancies; piezoelectric effect; piezoelectrically exited bulk acoustic waves; resonator design dependent loss; single crystalline langasite resonators; temperature 1470 C; Acoustic materials; Acoustic waves; Conductivity; Crystalline materials; Dielectric losses; Doping; Resonance; Resonant frequency; Temperature dependence; Temperature sensors;
fLanguage
English
Publisher
ieee
Conference_Titel
Ultrasonics Symposium (IUS), 2009 IEEE International
Conference_Location
Rome
ISSN
1948-5719
Print_ISBN
978-1-4244-4389-5
Electronic_ISBN
1948-5719
Type
conf
DOI
10.1109/ULTSYM.2009.5441473
Filename
5441473
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