• DocumentCode
    1992515
  • Title

    Material and resonator design dependant loss in langasite bulk acoustic wave resonators at high temperatures

  • Author

    Schulz, Michal ; Richter, Denny ; Fritze, Holger

  • Author_Institution
    LaserApplicationCenter, Clausthal Univ. of Technol., Goslar, Germany
  • fYear
    2009
  • fDate
    20-23 Sept. 2009
  • Firstpage
    1676
  • Lastpage
    1679
  • Abstract
    Single crystalline langasite (La3Ga5SiO14) resonators exhibit piezoelectrically exited bulk acoustic waves up to temperatures close to its melting point at 1470°C. The loss observed in bulk acoustic wave devices depends on the materials properties and the resonance frequency. Anticipated operation at extremely high temperatures requires the understanding of both influences and enables tailoring of both properties to reduce the loss. Electrical impedance spectroscopy and diffusion runs using stable isotopes are the key methods used to study the atomistic transport processes and the electromechanical properties of langasite. At elevated temperatures, electrical as well as mechanical loss contributions are found. In particular, oxygen vacancies are responsible for strong losses which can be, however, suppressed by light donor doping. Above 650°C, the impact of the conductivity related loss becomes pronounced. Further, the coupling of mechanical and electrical properties due to the piezoelectric effect causes a loss maximum at the dielectric relaxation frequency. Doping of langasite modifies the electrical conductivity and shifts, thereby, the dielectric relaxation frequency. Consequently, the choice of appropriate dopants and/or of the resonance frequency far off the latter frequency minimizes the loss. The concept is demonstrated and leads to an improved performance of resonant sensors at high temperatures.
  • Keywords
    acoustic resonators; bulk acoustic wave devices; crystal resonators; dielectric losses; dielectric relaxation; electrical conductivity; lanthanum compounds; piezoelectricity; La3Ga5SiO14; atomistic transport processes; dielectric relaxation frequency; diffusion; doping; electrical conductivity; electrical impedance spectroscopy; electrical loss; electromechanical properties; langasite bulk acoustic wave resonators; material dependent loss; mechanical loss; oxygen vacancies; piezoelectric effect; piezoelectrically exited bulk acoustic waves; resonator design dependent loss; single crystalline langasite resonators; temperature 1470 C; Acoustic materials; Acoustic waves; Conductivity; Crystalline materials; Dielectric losses; Doping; Resonance; Resonant frequency; Temperature dependence; Temperature sensors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium (IUS), 2009 IEEE International
  • Conference_Location
    Rome
  • ISSN
    1948-5719
  • Print_ISBN
    978-1-4244-4389-5
  • Electronic_ISBN
    1948-5719
  • Type

    conf

  • DOI
    10.1109/ULTSYM.2009.5441473
  • Filename
    5441473