Title : 
Recent proton and Co60 radiation test data from a newly developed European optocoupler source for space application
         
        
            Author : 
Bregoli, M. ; Hernandez, S. ; Ress, C. ; Collini, A. ; Ficorella, F. ; How, L.S. ; Costantino, Alessandra ; Ferlet-Cavrois, Veronique ; Zahir, M.
         
        
            Author_Institution : 
Optoelettronica Italia Srl, Gardolo, Italy
         
        
        
        
        
        
            Abstract : 
The permanent degradation introduced in the main electrical parameters of a newly developed European optocoupler type is described, as a function of proton fluences and Co-60 total ionizing dose. Optoi´s devices assembled in Leadless Chip Carrier packages, coded OIER10 are being developed in the framework of an ECI project for ESA, aimed at the ESCC evaluation of Optoi optocouplers. The first analyses of the recent irradiation results show a good behavior of the parts under proton and gamma irradiation.
         
        
            Keywords : 
cobalt; integrated circuit packaging; proton effects; space vehicle electronics; 60Co; European optocoupler source; OIER10 code; leadless chip carrier packages; proton fluences; proton test data; radiation test data; space application; total ionizing dose; Degradation; Europe; Light emitting diodes; Phototransistors; Protons; Radiation effects; Testing;
         
        
        
        
            Conference_Titel : 
Radiation and Its Effects on Components and Systems (RADECS), 2013 14th European Conference on
         
        
            Conference_Location : 
Oxford
         
        
        
            DOI : 
10.1109/RADECS.2013.6937401