DocumentCode :
1992624
Title :
A 7.9/5.5 psec room/low temperature SOI CMOS
Author :
Assaderaghi, F. ; Rausch, W. ; Ajmera, A. ; Leobandung, E. ; Schepis, D. ; Wagner, L. ; Wann, H.-J. ; Bolam, R. ; Yee, D. ; Davari, B. ; Shahidi, G.
Author_Institution :
IBM Corp., Hopewell Junction, NY, USA
fYear :
1997
fDate :
10-10 Dec. 1997
Firstpage :
415
Lastpage :
418
Abstract :
In this paper we demonstrate the fastest CMOS circuits reported to date. At room temperature the unloaded CMOS inverter delay as low as 7.85 psec is measured. This number drops to 5.5 psec at liquid nitrogen temperature. The devices used in the study are built on SOI, with excellent short-channel characteristics down to 0.06 /spl mu/m for the NFETs and 0.08 /spl mu/m for the PFETs. Although devices with high threshold voltages are used, record delays are achieved at relatively low supply voltages. At 1.8 V, the inverter delay is 8.3 psec and 5.9 psec at T=300 K and T=80 K, respectively. The corresponding delays at 1.2 V are 11.4 psec and 8.2 psec. Through proper device optimization, we demonstrate that undesired SOI floating-body effects are minimized as well. These results demonstrate that there is significant room for continued performance enhancement in scaled CMOS.
Keywords :
CMOS logic circuits; delays; elemental semiconductors; isolation technology; logic gates; silicon; silicon-on-insulator; 0.06 micron; 0.08 micron; 1.2 V; 1.8 V; 11.4 ps; 300 K; 5.5 ps; 5.9 ps; 7.9 ps; 8.2 ps; 8.3 ps; 80 K; NFETs; PFETs; Si; floating-body effects; inverter delay; low temperature SOI CMOS; scaled CMOS; short-channel characteristics; threshold voltages; unloaded CMOS inverter; CMOS technology; Current measurement; Delay; Inverters; MOS devices; Pulse measurements; Research and development; Silicides; Temperature; Threshold voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1997. IEDM '97. Technical Digest., International
Conference_Location :
Washington, DC, USA
ISSN :
0163-1918
Print_ISBN :
0-7803-4100-7
Type :
conf
DOI :
10.1109/IEDM.1997.650413
Filename :
650413
Link To Document :
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