Title :
Beamtest results of Lattice LFE2M20E FPGA
Author :
Erdmann, Ralph ; Gebelein, Jano ; Kebschull, Udo
Author_Institution :
Dept. of Comput. Eng., Cologne Univ. of Appl. Sci., Cologne, Germany
Abstract :
This paper presents beamtest data of the Lattice Semiconductor LFE2M20E, a 90nm SRAM FPGA, for use in areas under effects of ionizing radiation. It includes Single Event Effects (SEE) cross-section and maximum Total Ionizing Dose (TID) response. The device was irradiated with protons and heavy ions using particle accelerators at different beam time experiments.
Keywords :
SRAM chips; field programmable gate arrays; particle accelerators; proton effects; radiation hardening (electronics); Lattice Semiconductor LFE2M20E; SRAM FPGA; beamtest results; heavy ion beam effect; ionizing radiation effect; maximum total ionizing dose response; particle accelerators; proton beam effect; single event effects cross section; size 90 nm; Annealing; Field programmable gate arrays; Lattices; Particle beams; Radiation effects; Random access memory; Registers; Field programmable gate arrays; Ionizing radiation;
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2013 14th European Conference on
Conference_Location :
Oxford
DOI :
10.1109/RADECS.2013.6937405
