Title :
Bias conditions and functional test procedure influence on PowerPC7448 microprocessor TID tolerance
Author :
Karakozov, Andrey B. ; Korneev, Oleg V. ; Nekrasov, Pavel V. ; Sokolov, Michail N. ; Zagryadsky, Dmitry A.
Author_Institution :
Inst. of Extreme Appl. Electron., Nat. Res. Nucl. Univ. “MEPhI”, Moscow, Russia
Abstract :
TID test method and results for CMOS SOI PowerPC7884 microprocessor in gamma-rays are presented. Significant influence of bias conditions and functional test procedure on resulting TID tolerance level is noted.
Keywords :
CMOS digital integrated circuits; gamma-rays; integrated circuit testing; microprocessor chips; silicon-on-insulator; CMOS SOI PowerPC7884 microprocessor; Si; TID test method; TID tolerance level; bias conditions; functional test procedure influence; gamma-rays; Aerospace electronics; Electronic mail; Microprocessors; Performance evaluation; Phase locked loops; Radiation effects; Testing; PowerPC; TID; functional testing; microprocessors;
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2013 14th European Conference on
Conference_Location :
Oxford
DOI :
10.1109/RADECS.2013.6937407
