Title :
Study of SEL and SEU in SRAM using different laser techniques
Author :
Savchenkov, Dmitriy V. ; Chumakov, Alexander I. ; Petrov, Andrey G. ; Pechenkin, Alexander A. ; Egorov, Andrey N. ; Mavritskiy, Oleg B. ; Yanenko, Andrey V.
Author_Institution :
Dept. of Electron., Nat. Nucl. Res. Univ. “MEPhI”, Moscow, Russia
Abstract :
Single event upset (SEU) and single event latchup (SEL) laser testing results of SRAM CY62256 using both focused and local laser irradiation techniques are presented. Variable laser wavelength was used for SEU and SEL threshold linear energy transfer (LET) estimation. The backside laser irradiation technique was also applied. Laser testing results were compared to heavy ion testing ones.
Keywords :
SRAM chips; radiation hardening (electronics); CY62256; SEL; SEU; SRAM; laser irradiation techniques; laser techniques; laser testing; single event latchup; single event upset; Integrated circuits; Laser beams; Lasers; Radiation effects; Random access memory; Single event upsets; Testing; SEL; SEU; heavy ion testing; laser technique;
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2013 14th European Conference on
Conference_Location :
Oxford
DOI :
10.1109/RADECS.2013.6937411
