• DocumentCode
    1992792
  • Title

    Study of SEL and SEU in SRAM using different laser techniques

  • Author

    Savchenkov, Dmitriy V. ; Chumakov, Alexander I. ; Petrov, Andrey G. ; Pechenkin, Alexander A. ; Egorov, Andrey N. ; Mavritskiy, Oleg B. ; Yanenko, Andrey V.

  • Author_Institution
    Dept. of Electron., Nat. Nucl. Res. Univ. “MEPhI”, Moscow, Russia
  • fYear
    2013
  • fDate
    23-27 Sept. 2013
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Single event upset (SEU) and single event latchup (SEL) laser testing results of SRAM CY62256 using both focused and local laser irradiation techniques are presented. Variable laser wavelength was used for SEU and SEL threshold linear energy transfer (LET) estimation. The backside laser irradiation technique was also applied. Laser testing results were compared to heavy ion testing ones.
  • Keywords
    SRAM chips; radiation hardening (electronics); CY62256; SEL; SEU; SRAM; laser irradiation techniques; laser techniques; laser testing; single event latchup; single event upset; Integrated circuits; Laser beams; Lasers; Radiation effects; Random access memory; Single event upsets; Testing; SEL; SEU; heavy ion testing; laser technique;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems (RADECS), 2013 14th European Conference on
  • Conference_Location
    Oxford
  • Type

    conf

  • DOI
    10.1109/RADECS.2013.6937411
  • Filename
    6937411
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1992792